HEUFT eXaminer II XBL

More coverage during the top-down inspection

The HEUFT eXaminer ^II XBL achieves a new level of coverage during the careful and precise top-down inspection at the end of the line with perfected X-ray flash technology and an extra large full-field image converter. Oversized products and packaging material such as whole frozen pizza boxes and even complete trays are also inspected for foreign objects, defects and incompleteness completely gapless and without blind spots.
The new HEUFT eXaminer ^II XBL provides considerably more coverage with the unique pulsed X-rays with lifetime optimised high-voltage components and generators in addition to the proven multiple X-ray flash option which makes the careful and precise inspection of longer products and packaging materials possible. A single top-down strobe now generates X-ray flashes lasting a millisecond which also penetrate extra large products completely and strike an innovative, full coverage image converter.
For the first time gapless photographs of oversized primary and secondary packaging material such as frozen pizza boxes or entire yoghurt trays are possible besides those of compact end products such as chocolate bars, pouches, flow packs or thermoform packaging. The high-resolution images each show the complete product. They remain free of motion blurs or blurred or distorted border areas even at high or fluctuating conveyor speeds – in contrast to conventional X-ray scanners.
The HEUFT reflexx² image processing system divides the objects which can be clearly identified on them into different contrast categories in real time. In this way the small piece of metal in the cereal bar can be clearly distinguished from the nut, the plastic sphere in the fruit puree from the air bubble and the glass splinter on the pizza from the ham cube. Foreign objects as well as missing containers in the tray or faulty packaging components are also detected reliably.
A new type of retraction table in the extra wide conveyor which simply lets the faulty products fall through also enables the targeted rejection of more flexible packaging materials such as pouches or large size repackaged end products with which standard feed rejection systems have difficulties.
The separation between X-ray detection and the HEUFT SPECTRUM ^II control unit now also makes the uncomplicated integration of further inspection modules possible – for example for the safe verification of product marking as part of the same process. Furthermore it offers more flexibility for different installation positions for an end of line integration and makes maintenance easier. The highly automated HEUFT SPECTRUM ^II platform ensures extremely precise product tracking with impressive performance – from the infeed via the compact, safely encased X-ray unit and the additional detections to the reject verification.
Brand and program changes can be carried out quickly and easily without manual mechanical intervention and recalibration of the X-ray components. The HEUFT NaVi user guidance supports and assists the user individually and audiovisually.
Therefore the perfected pulsed X-ray and image conversion technology in the HEUFT eXaminer ^II XBL achieves a new level of coverage and precision during the careful top-down inspection at the end of the line with a significantly increased lifetime for fewer standstills and production downtimes.