FT SYSTEM was founded in 1998 and has become a leading supplier of container inspection and monitoring solutions. Our reputation for quality, reliability and customer satisfaction has made us the preferred supplier of inspection equipment to many of the leading manufacturers and system integrators in the food, beverage and chemical industries. Since our inception we have grown to become a global leader in inspection and control solutions with more than 6500 installations in over 60 countries around the world. Since 2009 FT System belongs to Arol Group, with Arol SpA being a leading supplier of capping machines, turrets, capping sorters and capping feeding systems worldwide.
FT System created its FOOD INSPECTION DIVISION with the mission of providing to the food companies innovative inspection solutions developed to guarantee the food safety and the quality of the final product. Our wide product range includes many solutions for packaging lines and laboratories. For MAP food products, FT System developed innovative solutions-based on laser spectroscopy-to perform leak detection and gas measuremen on 100% of the production, directly In Line.
L PRO [Gas Sensing] is the FT SYSTEM division dedicated to the laser spectroscopy technology. A revolutionary and innovative method, which has enabled the design and the realization of non destructive instruments of analysis and measurement of gas inside closed containers.
The main fields of application of L PRO technology are the bottling of wine, beer, water and soft drinks and even the wider industry and pharmaceutical industry.
INTEGRATED AND TOTAL QUALITY SOLUTIONS
The simple and intuitive multiple inspection stations along the entire packaging process can also be integrated into a single control panel for a total overview of the quality and production performance.
The heart of FT SYSTEM is its R&D team, assisted by a developed network of partnerships with universities and international research centers, dedicated to the most innovative and non-destructive inspection technologies: high frequency, X-ray, infrared, optical, laser, artificial acoustic and visual analysis.